- Series：
-
- Supply Voltage：
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- Logic Type：
-
- Conditions sélectionnées:
Découvrez les produits 35
 |
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Number of Bits | Supply Voltage | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Number of Bits | Supply Voltage | Logic Type | |
|
|
|
Texas Instruments |
1,690
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
Tray | 74LVTH | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC 20BIT SCAN TST DEV UBT 64LQFP
|
Tape & Reel (TR) | 74LVTH | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
1,625
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC 20BIT SCAN TST DEV UBT 64LQFP
|
Cut Tape (CT) | 74LVTH | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
1,625
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC 20BIT SCAN TST DEV UBT 64LQFP
|
- | 74LVTH | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC 18BIT SCAN TST DEV UBT 64LQFP
|
Tape & Reel (TR) | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
980
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC 18BIT SCAN TST DEV UBT 64LQFP
|
Cut Tape (CT) | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
980
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC 18BIT SCAN TST DEV UBT 64LQFP
|
- | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
|
Tape & Reel (TR) | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
406
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
|
Cut Tape (CT) | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
406
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
|
- | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
3,449
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
Tray | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
1,756
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
Tray | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
479
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
Tray | 74LVTH | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
355
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC LINK ADDRSS SCAN-PORT 64-LQFP
|
Tray | 74LVT | - | 2.7 V ~ 3.6 V | Linking Addressable Scan Ports | ||
|
|
|
Texas Instruments |
231
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABT | 20 | 4.5 V ~ 5.5 V | Scan Test Device with Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
303
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
Tray | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Texas Instruments |
299
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE ABT 64-LQFP
|
Tray | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Texas Instruments |
256
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC TXRX/REG 18BIT 3.3V 64-LQFP
|
Tube | 74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Texas Instruments |
292
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABTH | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers | ||
|
|
|
Texas Instruments |
457
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABT | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers |
