Texas Instruments

SN74ABT18652PM

Description :
IC SCAN-TEST-DEV/TXRX 64-LQFP
Forfait :
64-LQFP (10x10)
Logic Type :
Scan Test Device With Transceivers And Registers
Mounting Type :
Surface Mount
Number of Bits :
18
Operating Temperature :
-40°C ~ 85°C
Package / Case :
64-LQFP
Packaging :
Tray
Series :
74ABT
Supplier Device Package :
64-LQFP (10x10)
Supply Voltage :
4.5 V ~ 5.5 V

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