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Découvrez les produits 12
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Number of Bits | Logic Type | ||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Number of Bits | Logic Type | ||
Texas Instruments |
231
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABT | 20 | Scan Test Device with Universal Bus Transceivers | ||||
Texas Instruments |
292
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABTH | 18 | Scan Test Device With Transceivers And Registers | ||||
Texas Instruments |
457
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABT | 18 | Scan Test Device With Transceivers And Registers | ||||
Texas Instruments |
349
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABT | 18 | Scan Test Device With Transceivers And Registers | ||||
Texas Instruments |
245
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABT | 18 | Scan Test Device with Registered Bus Transceiver | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 18BIT 64LQFP
|
Tape & Reel (TR) | 74ABT | 18 | Scan Test Device with Registered Bus Transceiver | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN TEST DEVICE 20BIT 64LQFP
|
Tray | 74ABT | 20 | Scan Test Device with Universal Bus Transceivers | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN TEST DEVICE 18BIT 64LQFP
|
Tray | 74ABTH | 18 | Scan Test Device With Transceivers And Registers | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 20BIT 64LQFP
|
Tape & Reel (TR) | 74ABT | 20 | Scan Test Device with Universal Bus Transceivers | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 20BIT 64LQFP
|
Tape & Reel (TR) | 74ABT | 20 | Scan Test Device with Universal Bus Transceivers | ||||
Texas Instruments |
210
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABTH | 18 | Scan Test Device With Transceivers And Registers | ||||
Texas Instruments |
291
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 74ABTH | 18 | Scan Test Device With Transceivers And Registers |