- Series：
-
- Supply Voltage：
-
- Logic Type：
-
- Conditions sélectionnées:
Découvrez les produits 21
 |
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Number of Bits | Supply Voltage | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Number of Bits | Supply Voltage | Logic Type | |
|
|
|
Texas Instruments |
1,690
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
3,449
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
1,756
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
479
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
355
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC LINK ADDRSS SCAN-PORT 64-LQFP
|
74LVT | - | 2.7 V ~ 3.6 V | Linking Addressable Scan Ports | ||
|
|
|
Texas Instruments |
231
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABT | 20 | 4.5 V ~ 5.5 V | Scan Test Device with Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
303
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Texas Instruments |
299
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE ABT 64-LQFP
|
74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Texas Instruments |
292
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABTH | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers | ||
|
|
|
Texas Instruments |
457
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABT | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers | ||
|
|
|
Texas Instruments |
349
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABT | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers | ||
|
|
|
Texas Instruments |
245
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABT | 18 | 4.5 V ~ 5.5 V | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC 20BIT UNIV BUS TXRX 64-LQFP
|
74LVTH | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN TEST DEVICE 20BIT 64LQFP
|
74ABT | 20 | 4.5 V ~ 5.5 V | Scan Test Device with Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN TEST DEVICE 18BIT 64LQFP
|
74ABTH | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers | ||
|
|
Texas Instruments |
210
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABTH | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers |
