Texas Instruments

SN74LVTH18646APMG4

Description :
IC SCAN-TEST-DEV/XCVR 64-LQFP
Forfait :
64-LQFP (10x10)
Logic Type :
ABT Scan Test Device With Transceivers and Registers
Mounting Type :
Surface Mount
Number of Bits :
18
Operating Temperature :
-40°C ~ 85°C
Package / Case :
64-LQFP
Packaging :
Tray
Series :
74LVTH
Supplier Device Package :
64-LQFP (10x10)
Supply Voltage :
2.7 V ~ 3.6 V

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