Fabricant:
Découvrez les produits 83
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Series Operating Temperature Package / Case Supplier Device Package Number of Bits Supply Voltage Logic Type
SN74BCT8244ANTG4
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE BUFF 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 24-PDIP 8 4.5 V ~ 5.5 V Scan Test Device with Buffers
SN74BCT8245ANT
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE TXRX 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 24-PDIP 8 4.5 V ~ 5.5 V Scan Test Device with Bus Transceivers
SN74BCT8245ANTG4
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE TXRX 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 24-PDIP 8 4.5 V ~ 5.5 V Scan Test Device with Bus Transceivers
SN74BCT8373ANT
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE LATCH 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 24-PDIP 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Latches
SN74BCT8374ANT
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE W/FF 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 24-PDIP 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ANTG4
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE W/FF 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 24-PDIP 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74LS181N
Texas Instruments
Enquête
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MOQ: 90  MPQ: 1
IC ARTHMTC UNIT/FUN GEN 24-DIP
74LS 0°C ~ 70°C 24-DIP (0.600",15.24mm) 24-PDIP - 4.75 V ~ 5.25 V Arithmetic Logic Unit
SN74S1050N
Texas Instruments
Enquête
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MOQ: 200  MPQ: 1
IC 12-BIT BUS TERM ARRAY16-DIP
74S 0°C ~ 70°C 16-DIP (0.300",7.62mm) 16-PDIP 12 - Schottky Barrier Diode Bus-Termination Array
SN74S1050NG4
Texas Instruments
Enquête
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MOQ: 200  MPQ: 1
IC 12-BIT BUS TERM ARRAY16-DIP
74S 0°C ~ 70°C 16-DIP (0.300",7.62mm) 16-PDIP 12 - Schottky Barrier Diode Bus-Termination Array
HCF4089BEY
STMicroelectronics
Enquête
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MOQ: 2000  MPQ: 1
IC MULTIPLIER BINARY 16-DIP
4000B -55°C ~ 125°C 16-DIP (0.300",7.62mm) 16-DIP 4 3 V ~ 20 V Binary Rate Multiplier
HCF4527BEY
STMicroelectronics
Enquête
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MOQ: 2000  MPQ: 1
IC MULTIPEXER BCD RATE 16-DIP
4000B -55°C ~ 125°C 16-DIP (0.300",7.62mm) 16-DIP 4 3 V ~ 20 V BCD Rate Multiplier
N74F656AN,602
NXP USA Inc.
Enquête
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MOQ: 600  MPQ: 1
IC BUFFER/LDRIVER OCTAL 24-DIP
74F 0°C ~ 70°C 24-DIP (0.300",7.62mm) 24-DIP 8 4.5 V ~ 5.5 V Buffer/Driver with Parity
HEF4007UBP,652
NXP USA Inc.
Enquête
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MOQ: 1000  MPQ: 1
IC DUAL PAIR/INVERTER 14-DIP
4000B -55°C ~ 125°C 14-DIP (0.300",7.62mm) 14-DIP 3 3 V ~ 18 V Complementary Pair Plus Inverter
74HC283N,652
NXP USA Inc.
Enquête
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MOQ: 1000  MPQ: 1
IC 4BIT BINARY FULL ADDER 16-DIP
74HC -40°C ~ 125°C 16-DIP (0.300",7.62mm) 16-DIP 4 2 V ~ 6 V Binary Full Adder with Fast Carry
SN54LS181J
Texas Instruments
Enquête
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MOQ: 375  MPQ: 1
IC ARTHMTC UNIT/FUN GEN 24-DIP
- -55°C ~ 125°C 24-CDIP (0.600",15.24mm) 24-CDIP - 4.5 V ~ 5.5 V Arithmetic Logic Unit
CD4519BCN
ON Semiconductor
Enquête
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MOQ: 300  MPQ: 1
IC AND/OR OR 4BIT 16DIP
4000B - 16-DIP (0.300",7.62mm) 16-PDIP 4 - AND/OR
74F588PC
ON Semiconductor
Enquête
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MOQ: 57  MPQ: 1
GPIB COMPATIBLE OCTAL TRANSCEIV
74F 0°C ~ 70°C 16-DIP (0.300",7.62mm) 16-PDIP 8 4.5 V ~ 5.5 V -
SN74S1052N
Texas Instruments
Enquête
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MOQ: 180  MPQ: 1
IC 16-BIT BUS TERM ARRAY20-DIP
74S 0°C ~ 70°C 20-DIP (0.300",7.62mm) 20-PDIP 16 - Schottky Barrier Diode Bus-Termination Array
MC14007UBCP
ON Semiconductor
Enquête
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MOQ: 1075  MPQ: 1
IC INVERTER DUAL COMP 14DIP
4000B -55°C ~ 125°C 14-DIP (0.300",7.62mm) 14-PDIP 3 3 V ~ 18 V Complementary Pair Plus Inverter
MC14007UBCPG
ON Semiconductor
Enquête
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MOQ: 1500  MPQ: 1
IC INVERTER DUAL COMP 14DIP
4000B -55°C ~ 125°C 14-DIP (0.300",7.62mm) 14-PDIP 3 3 V ~ 18 V Complementary Pair Plus Inverter