- Series:
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- Operating Temperature:
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- Package / Case:
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- Supply Voltage:
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- Logic Type:
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- Conditions sélectionnées:
Découvrez les produits 18
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Package / Case | Number of Bits | Supply Voltage | Logic Type | ||
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Package / Case | Number of Bits | Supply Voltage | Logic Type | ||
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 45 MPQ: 1
|
IC ARITHMETIC LOGIC 4BIT 24-DIP
|
74F | 0°C ~ 70°C | 24-DIP (0.600",15.24mm) | 4 | 4.5 V ~ 5.5 V | Arithmetic Logic Unit | ||||
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 45 MPQ: 1
|
IC ARITHMETIC LOGIC 4BIT 24-DIP
|
74F | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 4 | 4.5 V ~ 5.5 V | Arithmetic Logic Unit | ||||
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 30 MPQ: 1
|
IC DRIVER/RCVR QUAD BUS 24-DIP
|
10H | 0°C ~ 75°C | 24-DIP (0.300",7.62mm) | 4 | - | Driver/Receiver | ||||
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 30 MPQ: 1
|
IC DRIVER/RCVR QUAD BUS 24-DIP
|
10H | 0°C ~ 75°C | 24-DIP (0.300",7.62mm) | 4 | - | Driver/Receiver | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 45 MPQ: 1
|
IC ARITHMETIC LOGIC UNIT 24DIP
|
74AS | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | - | 4.5 V ~ 5.5 V | Arithmetic Logic Unit | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 120 MPQ: 1
|
IC TRANSCEIVER 1-9BIT 24DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | 8-Bit to 9-Bit Parity Bus Transceiver | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Inverting Buffers | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Inverting Buffers | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE LATCH 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Latches | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE W/FF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE W/FF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | 8 | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 90 MPQ: 1
|
IC ARTHMTC UNIT/FUN GEN 24-DIP
|
74LS | 0°C ~ 70°C | 24-DIP (0.600",15.24mm) | - | 4.75 V ~ 5.25 V | Arithmetic Logic Unit | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 45 MPQ: 1
|
IC ARITHMETIC LOGIC UNIT 24DIP
|
74AS | 0°C ~ 70°C | 24-DIP (0.300",7.62mm) | - | 4.5 V ~ 5.5 V | Arithmetic Logic Unit | ||||
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 90 MPQ: 1
|
IC ARTHMTC UNIT/FUN GEN 24-DIP
|
74LS | 0°C ~ 70°C | 24-DIP (0.600",15.24mm) | - | 4.75 V ~ 5.25 V | Arithmetic Logic Unit |