Découvrez les produits 18
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Series Operating Temperature Package / Case Number of Bits Supply Voltage Logic Type
74F181PC
ON Semiconductor
Enquête
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MOQ: 45  MPQ: 1
IC ARITHMETIC LOGIC 4BIT 24-DIP
74F 0°C ~ 70°C 24-DIP (0.600",15.24mm) 4 4.5 V ~ 5.5 V Arithmetic Logic Unit
74F181SPC
ON Semiconductor
Enquête
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MOQ: 45  MPQ: 1
IC ARITHMETIC LOGIC 4BIT 24-DIP
74F 0°C ~ 70°C 24-DIP (0.300",7.62mm) 4 4.5 V ~ 5.5 V Arithmetic Logic Unit
MC10H330P
ON Semiconductor
Enquête
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MOQ: 30  MPQ: 1
IC DRIVER/RCVR QUAD BUS 24-DIP
10H 0°C ~ 75°C 24-DIP (0.300",7.62mm) 4 - Driver/Receiver
MC10H330PG
ON Semiconductor
Enquête
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MOQ: 30  MPQ: 1
IC DRIVER/RCVR QUAD BUS 24-DIP
10H 0°C ~ 75°C 24-DIP (0.300",7.62mm) 4 - Driver/Receiver
SN74AS181ANT
Texas Instruments
Enquête
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MOQ: 45  MPQ: 1
IC ARITHMETIC LOGIC UNIT 24DIP
74AS 0°C ~ 70°C 24-DIP (0.300",7.62mm) - 4.5 V ~ 5.5 V Arithmetic Logic Unit
SN74BCT29854NT
Texas Instruments
Enquête
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MOQ: 120  MPQ: 1
IC TRANSCEIVER 1-9BIT 24DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V 8-Bit to 9-Bit Parity Bus Transceiver
SN74BCT8240ANT
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE BUFF 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V Scan Test Device with Inverting Buffers
SN74BCT8240ANTG4
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE BUFF 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V Scan Test Device with Inverting Buffers
SN74BCT8244ANT
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE BUFF 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V Scan Test Device with Buffers
SN74BCT8244ANTG4
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE BUFF 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V Scan Test Device with Buffers
SN74BCT8245ANT
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE TXRX 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V Scan Test Device with Bus Transceivers
SN74BCT8245ANTG4
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE TXRX 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V Scan Test Device with Bus Transceivers
SN74BCT8373ANT
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE LATCH 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Latches
SN74BCT8374ANT
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE W/FF 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ANTG4
Texas Instruments
Enquête
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MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE W/FF 24-DIP
74BCT 0°C ~ 70°C 24-DIP (0.300",7.62mm) 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74LS181N
Texas Instruments
Enquête
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MOQ: 90  MPQ: 1
IC ARTHMTC UNIT/FUN GEN 24-DIP
74LS 0°C ~ 70°C 24-DIP (0.600",15.24mm) - 4.75 V ~ 5.25 V Arithmetic Logic Unit
SN74AS181ANTG4
Texas Instruments
Enquête
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MOQ: 45  MPQ: 1
IC ARITHMETIC LOGIC UNIT 24DIP
74AS 0°C ~ 70°C 24-DIP (0.300",7.62mm) - 4.5 V ~ 5.5 V Arithmetic Logic Unit
SN74LS181NG4
Texas Instruments
Enquête
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MOQ: 90  MPQ: 1
IC ARTHMTC UNIT/FUN GEN 24-DIP
74LS 0°C ~ 70°C 24-DIP (0.600",15.24mm) - 4.75 V ~ 5.25 V Arithmetic Logic Unit