- Series：
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- Operating Temperature：
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- Package / Case：
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- Supplier Device Package：
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- Supply Voltage：
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- Logic Type：
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- Conditions sélectionnées:
Découvrez les produits 14
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Package / Case | Supplier Device Package | Supply Voltage | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Package / Case | Supplier Device Package | Supply Voltage | Logic Type | |
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Texas Instruments |
1,126
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC TERMINATOR PROG DUAL 14-DIP
|
4000B | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 14-PDIP | 3 V ~ 18 V | Programmable Terminator | ||
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|
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Texas Instruments |
Enquête
|
- |
-
|
MOQ: 650 MPQ: 1
|
IC TERMINATOR PROG DUAL 14-DIP
|
4000B | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 14-PDIP | 3 V ~ 18 V | Programmable Terminator | ||
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|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 120 MPQ: 1
|
IC TRANSCEIVER 1-9BIT 24DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | Scan Test Device with Inverting Buffers | ||
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|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | Scan Test Device with Inverting Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE LATCH 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Latches | ||
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|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE W/FF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE W/FF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
NXP USA Inc. |
Enquête
|
- |
-
|
MOQ: 600 MPQ: 1
|
IC BUFFER/LDRIVER OCTAL 24-DIP
|
74F | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-DIP | 4.5 V ~ 5.5 V | Buffer/Driver with Parity | ||
|
|
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 57 MPQ: 1
|
GPIB COMPATIBLE OCTAL TRANSCEIV
|
74F | 0°C ~ 70°C | 16-DIP (0.300"，7.62mm) | 16-PDIP | 4.5 V ~ 5.5 V | - |
