- Series：
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- Operating Temperature：
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- Package / Case：
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- Supplier Device Package：
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- Number of Bits：
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- Supply Voltage：
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- Logic Type：
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- Conditions sélectionnées:
Découvrez les produits 143
 |
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Package / Case | Supplier Device Package | Number of Bits | Supply Voltage | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Package / Case | Supplier Device Package | Number of Bits | Supply Voltage | Logic Type | |
|
|
|
Maxim Integrated |
952
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC DCL QUAD 300MHZ ATE 80TQFP
|
ATE | 0°C ~ 70°C | 80-TQFP Exposed Pad | 80-TQFP-EP (12x12) | 4 | -1 V ~ 5.2 V | Comparator，Driver | ||
|
|
|
Texas Instruments |
1,690
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
3,449
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
1,756
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
479
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
355
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC LINK ADDRSS SCAN-PORT 64-LQFP
|
74LVT | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | - | 2.7 V ~ 3.6 V | Linking Addressable Scan Ports | ||
|
|
|
Texas Instruments |
231
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABT | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 20 | 4.5 V ~ 5.5 V | Scan Test Device with Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
303
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Texas Instruments |
299
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE ABT 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers | ||
|
|
|
Texas Instruments |
292
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers | ||
|
|
|
Texas Instruments |
457
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABT | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers | ||
|
|
|
Texas Instruments |
349
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABT | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 4.5 V ~ 5.5 V | Scan Test Device With Transceivers And Registers | ||
|
|
|
Texas Instruments |
720
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC 17BIT UNIV STRG XCVR 100HLQFP
|
74FB | 0°C ~ 70°C | 100-LQFP Exposed Pad | 100-HLQFP (14x14) | 17 | 4.5 V ~ 5.5 V | LVTTL/BTL Universal Storage Transceiver with Buffered Clock Line | ||
|
|
|
Texas Instruments |
245
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
74ABT | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 4.5 V ~ 5.5 V | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC 20BIT UNIV BUS TXRX 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 348 MPQ: 1
|
IC LINK ADDRSS SCAN-PORT 64-BGA
|
74LVT | -40°C ~ 85°C | 64-LFBGA | 64-BGA MICROSTAR (8x8) | - | 2.7 V ~ 3.6 V | Linking Addressable Scan Ports | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 20 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN TEST DEVICE 20BIT 64LQFP
|
74ABT | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 20 | 4.5 V ~ 5.5 V | Scan Test Device with Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 160 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 64-LQFP
|
74LVTH | -40°C ~ 85°C | 64-LQFP | 64-LQFP (10x10) | 18 | 2.7 V ~ 3.6 V | ABT Scan Test Device With Transceivers and Registers |
