- Series：
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- Operating Temperature：
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- Package / Case：
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- Supplier Device Package：
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- Mounting Type：
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- Supply Voltage：
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- Logic Type：
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- Conditions sélectionnées:
Découvrez les produits 171
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Operating Temperature | Package / Case | Supplier Device Package | Mounting Type | Supply Voltage | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Operating Temperature | Package / Case | Supplier Device Package | Mounting Type | Supply Voltage | Logic Type | |
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Texas Instruments |
3,627
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 24-SOIC
|
Tube | 74ABT | -40°C ~ 85°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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Texas Instruments |
736
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
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Tube | 74BCT | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||
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|
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Texas Instruments |
1,126
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC TERMINATOR PROG DUAL 14-DIP
|
Tube | 4000B | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 14-PDIP | Through Hole | 3 V ~ 18 V | Programmable Terminator | ||
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Texas Instruments |
Enquête
|
- |
-
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MOQ: 2000 MPQ: 1
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IC SCAN TEST DEV W/OBT 24-SOIC
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Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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|
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Texas Instruments |
260
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
Cut Tape (CT) | 74ABT | -40°C ~ 85°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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|
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Texas Instruments |
260
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
- | 74ABT | -40°C ~ 85°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
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Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC REG TXRX LVTTL-GTLP 48-TSSOP
|
Tape & Reel (TR) | 74GTLP | -40°C ~ 85°C | 48-TFSOP (0.240"，6.10mm Width) | 48-TSSOP | Surface Mount | 3.15 V ~ 3.45 V | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | ||
|
|
|
Texas Instruments |
2,970
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC REG TXRX LVTTL-GTLP 48-TSSOP
|
Cut Tape (CT) | 74GTLP | -40°C ~ 85°C | 48-TFSOP (0.240"，6.10mm Width) | 48-TSSOP | Surface Mount | 3.15 V ~ 3.45 V | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | ||
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Texas Instruments |
Enquête
|
- |
-
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MOQ: 1 MPQ: 1
|
IC REG TXRX LVTTL-GTLP 48-TSSOP
|
- | 74GTLP | -40°C ~ 85°C | 48-TFSOP (0.240"，6.10mm Width) | 48-TSSOP | Surface Mount | 3.15 V ~ 3.45 V | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | ||
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Texas Instruments |
Enquête
|
- |
-
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MOQ: 2000 MPQ: 1
|
IC REG XCVR LVTTL-GTLP 48-TSSOP
|
Tape & Reel (TR) | 74GTLP | -40°C ~ 85°C | 48-TFSOP (0.240"，6.10mm Width) | 48-TSSOP | Surface Mount | 3.15 V ~ 3.45 V | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | ||
|
|
|
Texas Instruments |
1,872
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC REG XCVR LVTTL-GTLP 48-TSSOP
|
Cut Tape (CT) | 74GTLP | -40°C ~ 85°C | 48-TFSOP (0.240"，6.10mm Width) | 48-TSSOP | Surface Mount | 3.15 V ~ 3.45 V | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | ||
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|
|
Texas Instruments |
1,872
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC REG XCVR LVTTL-GTLP 48-TSSOP
|
- | 74GTLP | -40°C ~ 85°C | 48-TFSOP (0.240"，6.10mm Width) | 48-TSSOP | Surface Mount | 3.15 V ~ 3.45 V | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | ||
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|
|
Texas Instruments |
1,185
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SSOP
|
Tube | 74ABT | -40°C ~ 85°C | 28-BSSOP (0.295"，7.50mm Width) | 28-SSOP | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
Texas Instruments |
196
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SOIC
|
Tube | 74ABT | -40°C ~ 85°C | 28-SOIC (0.295"，7.50mm Width) | 28-SOIC | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceiver and Registers | ||
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|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-SOIC
|
Tape & Reel (TR) | 74BCT | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
755
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 28-SOIC
|
Tube | 74ABT | -40°C ~ 85°C | 28-SOIC (0.295"，7.50mm Width) | 28-SOIC | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
200
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 28-SSOP
|
Tube | 74ABT | -40°C ~ 85°C | 28-BSSOP (0.295"，7.50mm Width) | 28-SSOP | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
231
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SSOP
|
Tube | 74ABT | -40°C ~ 85°C | 28-BSSOP (0.295"，7.50mm Width) | 28-SSOP | Surface Mount | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceiver and Registers | ||
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|
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Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC EMBEDDED TEST BUS CTRL 24SOIC
|
Tape & Reel (TR) | 74LVT | -40°C ~ 85°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
1,711
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC EMBEDDED TEST BUS CTRL 24SOIC
|
Cut Tape (CT) | 74LVT | -40°C ~ 85°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers |
