Découvrez les produits 24
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Series Operating Temperature Number of Bits Supply Voltage Logic Type
SN74ABT8245DWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC SCAN TEST DEV W/OBT 24-SOIC
74ABT -40°C ~ 85°C 8 4.5 V ~ 5.5 V Scan Test Device with Bus Transceivers
SN74BCT8245ADWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE TXRX 24-SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V Scan Test Device with Bus Transceivers
SN74LVT8980AIDWREP
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC EMBEDDED TEST BUS CTRL 24SOIC
74LVT -40°C ~ 85°C 8 2.7 V ~ 3.6 V Embedded Test-Bus Controllers
SN74TVC3010DWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC 10BIT VOLTAGE CLAMP 24-SOIC
- -40°C ~ 85°C 10 - Voltage Clamp
SN74LVT8996DWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC 10-BIT SCAN PORT XCVR 24-SOIC
74LVT -40°C ~ 85°C 10 2.7 V ~ 3.6 V Addressable Scan Ports
SN74LVT8980ADWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC TEST-BUS CONTROLLER 24-SOIC
74LVT -40°C ~ 85°C 8 2.7 V ~ 3.6 V Embedded Test-Bus Controllers
SN74LVT8980ADWRG4
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC TEST-BUS CONTROLLER 24-SOIC
74LVT -40°C ~ 85°C 8 2.7 V ~ 3.6 V Embedded Test-Bus Controllers
SN74ABT8996DWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC ADDRESSABLE SCAN PORT 24-SOIC
74ABT -40°C ~ 85°C 10 4.5 V ~ 5.5 V Addressable Scan Ports
SN74AS181ADWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC ARITHMETIC LOGIC UNIT 24-SOIC
74AS 0°C ~ 70°C - 4.5 V ~ 5.5 V Arithmetic Logic Unit
SN74AS181ADWRE4
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC ARITHMETIC LOGIC UNIT 24-SOIC
74AS 0°C ~ 70°C - 4.5 V ~ 5.5 V Arithmetic Logic Unit
SN74BCT29854DWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC TRANSCEIVER 1-9BIT 24SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V 8-Bit to 9-Bit Parity Bus Transceiver
SN74BCT29854DWRE4
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC TRANSCEIVER 1-9BIT 24SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V 8-Bit to 9-Bit Parity Bus Transceiver
SN74BCT8240ADWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE BUFF 24-SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V Scan Test Device with Inverting Buffers
SN74BCT8240ADWRE4
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE BUFF 24-SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V Scan Test Device with Inverting Buffers
SN74BCT8244ADWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE BUFF 24-SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V Scan Test Device with Buffers
SN74BCT8373ADWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE LATCH 24SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Latches
SN74BCT8373ADWRE4
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE LATCH 24SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Latches
SN74BCT8374ADWR
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE W/FF 24-SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74BCT8374ADWRE4
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE W/FF 24-SOIC
74BCT 0°C ~ 70°C 8 4.5 V ~ 5.5 V Scan Test Device with D-Type Edge-Triggered Flip-Flops
SN74AS181ADWRG4
Texas Instruments
Enquête
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MOQ: 2000  MPQ: 1
IC ARITHMETIC LOGIC UNIT 24SOIC
74AS 0°C ~ 70°C - 4.5 V ~ 5.5 V Arithmetic Logic Unit