Texas Instruments

SN74BCT8374ADWR

Description :
IC SCAN TEST DEVICE W/FF 24-SOIC
Forfait :
24-SOIC
Logic Type :
Scan Test Device with D-Type Edge-Triggered Flip-Flops
Mounting Type :
Surface Mount
Number of Bits :
8
Operating Temperature :
0°C ~ 70°C
Package / Case :
24-SOIC (0.295",7.50mm Width)
Packaging :
Tape & Reel (TR)
Series :
74BCT
Supplier Device Package :
24-SOIC
Supply Voltage :
4.5 V ~ 5.5 V

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