Découvrez les produits 9
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Packaging Supplier Device Package Number of Bits Logic Type
SN74ABT8245DW
Texas Instruments
3,627
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN TEST DEV/TXRX 24-SOIC
Tube 24-SOIC 8 Scan Test Device with Bus Transceivers
SN74ABT8245DWR
Texas Instruments
Enquête
-
-
MOQ: 2000  MPQ: 1
IC SCAN TEST DEV W/OBT 24-SOIC
Tape & Reel (TR) 24-SOIC 8 Scan Test Device with Bus Transceivers
SN74ABT8245DWR
Texas Instruments
260
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN TEST DEV W/OBT 24-SOIC
Cut Tape (CT) 24-SOIC 8 Scan Test Device with Bus Transceivers
SN74ABT8245DWR
Texas Instruments
260
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN TEST DEV W/OBT 24-SOIC
- 24-SOIC 8 Scan Test Device with Bus Transceivers
SN74ABT8245DWG4
Texas Instruments
Enquête
-
-
MOQ: 100  MPQ: 1
IC SCAN TEST DEVICE 24SOIC
Tube 24-SOIC 8 Scan Test Device with Bus Transceivers
SN74ABT8996DW
Texas Instruments
Enquête
-
-
MOQ: 50  MPQ: 1
IC ADDRESSABLE SCAN PORT 24-SOIC
Tube 160-NFBGA (9x13) 10 Addressable Scan Ports
SN74ABT8996DWR
Texas Instruments
Enquête
-
-
MOQ: 2000  MPQ: 1
IC ADDRESSABLE SCAN PORT 24-SOIC
Tape & Reel (TR) 24-SOIC 10 Addressable Scan Ports
SN74ABT8996DWR
Texas Instruments
Enquête
-
-
MOQ: 1  MPQ: 1
IC ADDRESSABLE SCAN PORT 24-SOIC
Cut Tape (CT) 24-SOIC 10 Addressable Scan Ports
SN74ABT8996DWR
Texas Instruments
Enquête
-
-
MOQ: 1  MPQ: 1
IC ADDRESSABLE SCAN PORT 24-SOIC
- 24-SOIC 10 Addressable Scan Ports