- Package / Case：
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- Supplier Device Package：
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- Logic Type：
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- Conditions sélectionnées:
Découvrez les produits 76
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Package / Case | Supplier Device Package | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Package / Case | Supplier Device Package | Number of Bits | Logic Type | |
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|
|
Texas Instruments |
3,627
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 24-SOIC
|
Tube | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
Tape & Reel (TR) | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
260
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
Cut Tape (CT) | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
260
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
- | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
1,185
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SSOP
|
Tube | 28-BSSOP (0.295"，7.50mm Width) | 28-SSOP | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
196
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SOIC
|
Tube | 28-SOIC (0.295"，7.50mm Width) | 28-SOIC | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 56-SSOP
|
Tape & Reel (TR) | 56-BSSOP (0.295"，7.50mm Width) | 56-SSOP | 18 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
972
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 56-SSOP
|
Cut Tape (CT) | 56-BSSOP (0.295"，7.50mm Width) | 56-SSOP | 18 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
972
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 56-SSOP
|
- | 56-BSSOP (0.295"，7.50mm Width) | 56-SSOP | 18 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 56-TSSOP
|
Tape & Reel (TR) | 56-TFSOP (0.240"，6.10mm Width) | 56-TSSOP | 18 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
5,703
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 56-TSSOP
|
Cut Tape (CT) | 56-TFSOP (0.240"，6.10mm Width) | 56-TSSOP | 18 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
5,703
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 56-TSSOP
|
- | 56-TFSOP (0.240"，6.10mm Width) | 56-TSSOP | 18 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
755
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 28-SOIC
|
Tube | 28-SOIC (0.295"，7.50mm Width) | 28-SOIC | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
950
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 56-SSOP
|
Tube | 56-BSSOP (0.295"，7.50mm Width) | 56-SSOP | 18 | Scan Test Device with Inverting Bus Transceivers | ||
|
|
|
Texas Instruments |
200
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 28-SSOP
|
Tube | 28-BSSOP (0.295"，7.50mm Width) | 28-SSOP | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
231
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SSOP
|
Tube | 28-BSSOP (0.295"，7.50mm Width) | 28-SSOP | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
231
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 64-LQFP | 64-LQFP (10x10) | 20 | Scan Test Device with Universal Bus Transceivers | ||
|
|
|
Texas Instruments |
457
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 64-LQFP | 64-LQFP (10x10) | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
Texas Instruments |
349
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 64-LQFP | 64-LQFP (10x10) | 18 | Scan Test Device With Transceivers And Registers | ||
|
|
|
Texas Instruments |
245
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/TXRX 64-LQFP
|
Tray | 64-LQFP | 64-LQFP (10x10) | 18 | Scan Test Device with Registered Bus Transceiver |
