Découvrez les produits 22
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Package / Case Supplier Device Package Number of Bits Logic Type
SN74ABT8245DW
Texas Instruments
3,627
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN TEST DEV/TXRX 24-SOIC
24-SOIC (0.295",7.50mm Width) 24-SOIC 8 Scan Test Device with Bus Transceivers
SN74ABT8646DL
Texas Instruments
1,185
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 28-SSOP
28-BSSOP (0.295",7.50mm Width) 28-SSOP 8 Scan Test Device with Bus Transceiver and Registers
SN74ABT8646DW
Texas Instruments
196
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 28-SOIC
28-SOIC (0.295",7.50mm Width) 28-SOIC 8 Scan Test Device with Bus Transceiver and Registers
SN74ABT8543DW
Texas Instruments
755
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN TEST DEV/TXRX 28-SOIC
28-SOIC (0.295",7.50mm Width) 28-SOIC 8 Scan Test Device with Registered Bus Transceiver
SN74ABT18640DL
Texas Instruments
950
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/TXRX 56-SSOP
56-BSSOP (0.295",7.50mm Width) 56-SSOP 18 Scan Test Device with Inverting Bus Transceivers
SN74ABT8543DL
Texas Instruments
200
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN TEST DEV/TXRX 28-SSOP
28-BSSOP (0.295",7.50mm Width) 28-SSOP 8 Scan Test Device with Registered Bus Transceiver
SN74ABT8652DL
Texas Instruments
231
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 28-SSOP
28-BSSOP (0.295",7.50mm Width) 28-SSOP 8 Scan Test Device with Bus Transceiver and Registers
SN74ABT8652DW
Texas Instruments
50
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN TEST DEVICE 28-SOIC
28-SOIC (0.295",7.50mm Width) 28-SOIC 8 Scan Test Device with Bus Transceiver and Registers
SN74ABT18245ADL
Texas Instruments
97
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/TXRX 56-SSOP
56-BSSOP (0.295",7.50mm Width) 56-SSOP 18 Scan Test Device with Bus Transceivers
SN74ABT8245DWG4
Texas Instruments
Enquête
-
-
MOQ: 100  MPQ: 1
IC SCAN TEST DEVICE 24SOIC
24-SOIC (0.295",7.50mm Width) 24-SOIC 8 Scan Test Device with Bus Transceivers
SN74ABT8646DLG4
Texas Instruments
Enquête
-
-
MOQ: 80  MPQ: 1
IC SCAN TEST DEVICE 28-SSOP
28-BSSOP (0.295",7.50mm Width) 28-SSOP 8 Scan Test Device with Bus Transceiver and Registers
SN74ABT8652DLG4
Texas Instruments
Enquête
-
-
MOQ: 40  MPQ: 1
IC SCAN TEST DEVICE 28-SSOP
28-BSSOP (0.295",7.50mm Width) 28-SSOP 8 Scan Test Device with Bus Transceiver and Registers
SN74ABT8996PW
Texas Instruments
Enquête
-
-
MOQ: 60  MPQ: 1
IC ADDRESSABLE SCAN PORT 24TSSOP
24-TSSOP (0.173",4.40mm Width) 24-TSSOP 10 Addressable Scan Ports
SN74ABT8996DW
Texas Instruments
Enquête
-
-
MOQ: 50  MPQ: 1
IC ADDRESSABLE SCAN PORT 24-SOIC
24-SOIC (0.295",7.50mm Width) 160-NFBGA (9x13) 10 Addressable Scan Ports
SN74ABT8952DW
Texas Instruments
Enquête
-
-
MOQ: 60  MPQ: 1
IC SCAN-TEST-DEV/XCVR 28-SOIC
28-SOIC (0.295",7.50mm Width) 28-SOIC 8 Scan Test Device with Registered Bus Transceiver
SN74ABT8952DL
Texas Instruments
Enquête
-
-
MOQ: 40  MPQ: 1
IC SCAN-TEST-DEV/XCVR 28-SSOP
28-BSSOP (0.295",7.50mm Width) 28-SSOP 8 Scan Test Device with Registered Bus Transceiver
74ABT899CMSA
ON Semiconductor
Enquête
-
-
MOQ: 141  MPQ: 1
TXRX W/GENERATOR&CHECKER 28SSOP
28-SSOP (0.209",5.30mm Width) 28-SSOP 9 Parity Generator/Checker
74ABT899CSC
ON Semiconductor
Enquête
-
-
MOQ: 52  MPQ: 1
TXRX W/GENERATOR&CHECKER 28SOIC
28-SOIC (0.295",7.50mm Width) 28-SOIC 9 Parity Generator/Checker
74ABT899CQC
ON Semiconductor
Enquête
-
-
MOQ: 140  MPQ: 1
TXRX W/GENERATOR&CHECKER 28PLCC
28-LCC (J-Lead) 28-PLCC (11.5x11.5) 9 Parity Generator/Checker
74ABT899A,602
NXP USA Inc.
Enquête
-
-
MOQ: 2368  MPQ: 1
IC 9BIT DUAL LATCH TXRX 28PLCC
28-LCC (J-Lead) 28-PLCC (11.51x11.51) 9 Parity Generator/Checker