Découvrez les produits 8
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Voltage - Max Capacitance - Input Attenuation Value Bandwidth Resistance - Input
CT4068-EU
Cal Test Electronics
Enquête
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-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 35 MHZ 1.
800V (DC + AC Peak) 1.7pF 10:1,100:1 35MHz 9M
CT4068-NA
Cal Test Electronics
Enquête
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-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 35 MHZ 1.
800V (DC + AC Peak) 1.7pF 10:1,100:1 35MHz 9M
CT4076-EU
Cal Test Electronics
Enquête
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-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 35MHZ 15K
7500V (7.5kV) (DC + AC Peak) 1.3pF 100:1,1000:1 35MHz 50M
CT4076-NA
Cal Test Electronics
Enquête
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-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 35MHZ 15K
7500V (7.5kV) (DC + AC Peak) 1.3pF 100:1,1000:1 35MHz 50M
CT4079-EU
Cal Test Electronics
Enquête
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-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 50 MHZ 30
15000V (15kV) (DC + AC Peak) 1.3pF 200:1,2000:1 50MHz 40M
CT4079-NA
Cal Test Electronics
Enquête
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-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 50MHZ 3 K
15000V (15kV) (DC + AC Peak) 1.3pF 200:1,2000:1 50MHz 40M
CT4078-EU
Cal Test Electronics
Enquête
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-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 120MHZ 22
11000V (11kV) (DC + AC Peak) 1pF 30:1,100:1,300:1,1000:1,3000:1 120MHz 100M
CT4078-NA
Cal Test Electronics
Enquête
-
-
MOQ: 1  MPQ: 1
DIFFERENTIAL PROBE KIT 120MHZ 22
11000V (11kV) (DC + AC Peak) 1pF 30:1,100:1,300:1,1000:1,3000:1 120MHz 100M