Découvrez les produits 24
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Operating Temperature Package / Case Supplier Device Package Voltage - Input Sensing Method
STEF12PUR
STMicroelectronics
3,000
3 jours
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 12V 10DFN
-40°C ~ 125°C (TJ) 10-VFDFN Exposed Pad 10-DFN (3x3) 7.6 V ~ 18 V -
STEF12EPUR
STMicroelectronics
6,000
3 jours
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 12V 10DFN
-40°C ~ 125°C (TJ) 10-VFDFN Exposed Pad 10-DFN (3x3) 7.6 V ~ 18 V -
NIS5135MN1-FN-7
Diodes Incorporated
3,000
3 jours
-
MOQ: 3000  MPQ: 1
IC LOAD SWITCH 10UDFN
-40°C ~ 150°C 10-UFDFN Exposed Pad U-DFN3030-10 3.1 V ~ 18 V High-Side
NIS5132MN1-FN-7
Diodes Incorporated
3,000
3 jours
-
MOQ: 3000  MPQ: 1
IC LOAD SWITCH 12V 3.6A 10-UDFN
-40°C ~ 150°C 10-UFDFN Exposed Pad U-DFN3030-10 9 V ~ 18 V High-Side
STEF033JR
STMicroelectronics
Enquête
-
-
MOQ: 5000  MPQ: 1
ELECTRONIC FUSE FOR 3.3 V LINE
-40°C ~ 125°C (TJ) 9-UFBGA,FCBGA 9-FlipChip (1.2x1.2) 3.1 V ~ 8 V -
NIS5135MN2-FN-7
Diodes Incorporated
Enquête
-
-
MOQ: 3000  MPQ: 1
IC LOAD SWITCH 10UDFN
-40°C ~ 150°C 10-UFDFN Exposed Pad U-DFN3030-10 3.1 V ~ 18 V High-Side
STEF05PUR
STMicroelectronics
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 5V 10DFN
-40°C ~ 125°C (TJ) 10-VFDFN Exposed Pad 10-DFN (3x3) 3.1 V ~ 10 V -
STEF05DPUR
STMicroelectronics
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 3.6AV 10DFN
-40°C ~ 125°C (TJ) 10-VFDFN Exposed Pad 10-DFN (3x3) 3.1 V ~ 10 V -
STEF033PUR
STMicroelectronics
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 3.3V 10VFDFPN
-40°C ~ 125°C (TJ) 10-VFDFN Exposed Pad 10-DFN (3x3) 3.1 V ~ 8 V -
STEF033APUR
STMicroelectronics
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 3.3V 10VDFPN
-40°C ~ 125°C (TJ) 10-VFDFN Exposed Pad 10-DFN (3x3) 3.1 V ~ 8 V -
STEF033AJR
STMicroelectronics
Enquête
-
-
MOQ: 5000  MPQ: 1
ELECTRONIC FUSE FOR 3.3 V LINE
-40°C ~ 125°C (TJ) 9-UFBGA,FCBGA 9-FlipChip (1.2x1.2) 3.1 V ~ 8 V -
NIS5135MN2TXG
ON Semiconductor
3,000
3 jours
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 5V 10DFN
-40°C ~ 150°C 10-VFDFN Exposed Pad 10-DFN (3x3) 3.1 V ~ 18 V High-Side
NIS5132MN1TXG
ON Semiconductor
9,000
3 jours
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 10DFN
-40°C ~ 150°C 10-VFDFN Exposed Pad 10-DFN (3x3) 9 V ~ 18 V High-Side
NIS5135MN1TXG
ON Semiconductor
3,000
3 jours
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 10DFN
-40°C ~ 150°C 10-VFDFN Exposed Pad 10-DFN (3x3) 3.1 V ~ 18 V High-Side
NIS5132MN2TXG
ON Semiconductor
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 12V 10DFN
-40°C ~ 150°C 10-VFDFN Exposed Pad 10-DFN (3x3) 9 V ~ 18 V High-Side
NIS5132MN3TXG
ON Semiconductor
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 12V 10-DFN
-40°C ~ 150°C 10-VFDFN Exposed Pad 10-DFN (3x3) 9 V ~ 18 V High-Side
STEF05LAPUR
STMicroelectronics
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 5V LINE DFN
-40°C ~ 125°C (TJ) 10-TFDFN Exposed Pad 10-DFN (3x3) 4.5 V ~ 8 V -
STEF05LPUR
STMicroelectronics
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE 5V LINE DFN
-40°C ~ 125°C (TJ) 10-VFDFN Exposed Pad 10-DFN (3x3) 4.5 V ~ 8 V -
STEF05DHPUR
STMicroelectronics
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE
-40°C ~ 125°C (TJ) 10-VFDFN Exposed Pad 10-DFN (3x3) 3.1 V ~ 10 V -
STEF12WHPUR
STMicroelectronics
Enquête
-
-
MOQ: 3000  MPQ: 1
IC ELECTRONIC FUSE
-40°C ~ 125°C (TJ) 10-VFDFN Exposed Pad 10-DFN (3x3) 7.6 V ~ 18 V -