Découvrez les produits 9
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Series Operating Temperature Package / Case Supplier Device Package Current - Output Sensing Method Accuracy
TPS25921ADR
Texas Instruments
95,000
3 jours
-
MOQ: 2500  MPQ: 1
IC PWR MGR EFUSE 18V 8SOIC
- -40°C ~ 125°C (TJ) 8-SOIC (0.154",3.90mm Width) 8-SOIC 1.7A - ±2%
TPS259271DRCR
Texas Instruments
12,000
3 jours
-
MOQ: 3000  MPQ: 1
IC EFUSE 18V BFET DVR 5A 10VSON
- -40°C ~ 85°C (TA) 10-VFDFN Exposed Pad 10-VSON (3x3) 5A - ±8%
TPS25921LDR
Texas Instruments
2,500
3 jours
-
MOQ: 2500  MPQ: 1
IC PWR MGR EFUSE 18V 8SOIC
- -40°C ~ 125°C (TJ) 8-SOIC (0.154",3.90mm Width) 8-SOIC 1.7A - ±2%
TPS259270DRCR
Texas Instruments
6,000
3 jours
-
MOQ: 3000  MPQ: 1
IC EFUSE 18V BFET DVR 5A 10VSON
- -40°C ~ 85°C (TA) 10-VFDFN Exposed Pad 10-VSON (3x3) 5A - ±8%
TPS259271DRCT
Texas Instruments
1,250
3 jours
-
MOQ: 250  MPQ: 1
IC EFUSE 18V BFET DVR 5A 10VSON
- -40°C ~ 85°C (TA) 10-VFDFN Exposed Pad 10-VSON (3x3) 5A - ±8%
TPS2592ZADRCR
Texas Instruments
Enquête
-
-
MOQ: 3000  MPQ: 1
IC PWR MGR EFUSE 3-20V 10SON
- -40°C ~ 85°C (TA) 10-VFDFN Exposed Pad 10-VSON (3x3) 1.7A - -
TPS259270DRCT
Texas Instruments
500
3 jours
-
MOQ: 250  MPQ: 1
IC EFUSE 18V BFET DVR 5A 10VSON
- -40°C ~ 85°C (TA) 10-VFDFN Exposed Pad 10-VSON (3x3) 5A - ±8%
NCP81295MNTXG
ON Semiconductor
Enquête
-
-
MOQ: 2500  MPQ: 1
HOT SWAP SMART FUSE
SENSEFET -40°C ~ 125°C 32-LFQFN Exposed Pad 32-LQFN (5x5) 50A High-Side ±6%
TPS2592ZADRCT
Texas Instruments
Enquête
-
-
MOQ: 500  MPQ: 1
IC PWR MGR EFUSE 3-20V 10VSON
- -40°C ~ 85°C (TA) 10-VFDFN Exposed Pad 10-VSON (3x3) 1.7A - -