Découvrez les produits 5
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Packaging Package / Case Supplier Device Package Mounting Type
SN74BCT8373ADW
Texas Instruments
Enquête
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-
MOQ: 75  MPQ: 1
IC SCAN TEST DEVICE LATCH 24SOIC
Tube 24-SOIC (0.295",7.50mm Width) 24-SOIC Surface Mount
SN74BCT8373ADWR
Texas Instruments
Enquête
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-
MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE LATCH 24SOIC
Tape & Reel (TR) 24-SOIC (0.295",7.50mm Width) 24-SOIC Surface Mount
SN74BCT8373ADWRE4
Texas Instruments
Enquête
-
-
MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE LATCH 24SOIC
Tape & Reel (TR) 24-SOIC (0.295",7.50mm Width) 24-SOIC Surface Mount
SN74BCT8373ANT
Texas Instruments
Enquête
-
-
MOQ: 60  MPQ: 1
IC SCAN TEST DEVICE LATCH 24-DIP
Tube 24-DIP (0.300",7.62mm) 24-PDIP Through Hole
SN74BCT8373ADWRG4
Texas Instruments
Enquête
-
-
MOQ: 2000  MPQ: 1
IC SCAN TEST DEVICE 24SOIC
Tape & Reel (TR) 24-SOIC (0.295",7.50mm Width) 24-SOIC Surface Mount