- Packaging：
-
- Supply Voltage：
-
- Conditions sélectionnées:
Découvrez les produits 20
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Number of Bits | Supply Voltage | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Number of Bits | Supply Voltage | Logic Type | |
|
|
|
Texas Instruments |
3,627
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 24-SOIC
|
Tube | 74ABT | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
Tape & Reel (TR) | 74ABT | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
260
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
Cut Tape (CT) | 74ABT | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
260
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV W/OBT 24-SOIC
|
- | 74ABT | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC EMBEDDED TEST BUS CTRL 24SOIC
|
Tape & Reel (TR) | 74LVT | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
1,711
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC EMBEDDED TEST BUS CTRL 24SOIC
|
Cut Tape (CT) | 74LVT | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
1,711
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC EMBEDDED TEST BUS CTRL 24SOIC
|
- | 74LVT | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC 10BIT VOLTAGE CLAMP 24-SOIC
|
Tape & Reel (TR) | - | 10 | - | Voltage Clamp | ||
|
|
|
Texas Instruments |
672
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC 10BIT VOLTAGE CLAMP 24-SOIC
|
Cut Tape (CT) | - | 10 | - | Voltage Clamp | ||
|
|
|
Texas Instruments |
672
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC 10BIT VOLTAGE CLAMP 24-SOIC
|
- | - | 10 | - | Voltage Clamp | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 325 MPQ: 1
|
IC 10BIT VOLTAGE CLAMP 24-SOIC
|
Tube | - | 10 | - | Voltage Clamp | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 100 MPQ: 1
|
IC SCAN TEST DEVICE 24SOIC
|
Tube | 74ABT | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC 10-BIT SCAN PORT XCVR 24-SOIC
|
Tape & Reel (TR) | 74LVT | 10 | 2.7 V ~ 3.6 V | Addressable Scan Ports | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC TEST-BUS CONTROLLER 24-SOIC
|
Tape & Reel (TR) | 74LVT | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC TEST-BUS CONTROLLER 24-SOIC
|
Tape & Reel (TR) | 74LVT | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC 10-BIT SCAN PORT XCVR 24-SOIC
|
Tube | 74LVT | 10 | 2.7 V ~ 3.6 V | Addressable Scan Ports | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC TEST-BUS CONTROLLER 24-SOIC
|
Tube | 74LVT | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC ADDRESSABLE SCAN PORT 24-SOIC
|
Tape & Reel (TR) | 74ABT | 10 | 4.5 V ~ 5.5 V | Addressable Scan Ports | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1 MPQ: 1
|
IC ADDRESSABLE SCAN PORT 24-SOIC
|
Cut Tape (CT) | 74ABT | 10 | 4.5 V ~ 5.5 V | Addressable Scan Ports | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1 MPQ: 1
|
IC ADDRESSABLE SCAN PORT 24-SOIC
|
- | 74ABT | 10 | 4.5 V ~ 5.5 V | Addressable Scan Ports |
