- Series：
-
- Operating Temperature：
-
- Conditions sélectionnées:
Découvrez les produits 12
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Number of Bits | Logic Type | |
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Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN-PATH LINKER 28-SOIC
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74ACT | 0°C ~ 70°C | 4 | SCAN-PATH LINKERS | ||
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ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
TXRX W/GENERATOR&CHECKER 28SOIC
|
74ABT | -40°C ~ 85°C | 9 | Parity Generator/Checker | ||
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Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Registered Bus Transceiver | ||
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|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28SOIC
|
74ABT | -40°C ~ 85°C | 8 | Scan Test Device with Registered Bus Transceiver |
