Découvrez les produits 8
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Package / Case Number of Bits Logic Type
SN74ABT8646DLR
Texas Instruments
Enquête
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MOQ: 1000  MPQ: 1
IC SCAN TEST DEVICE 28-SSOP
28-BSSOP (0.295",7.50mm Width) 8 Scan Test Device with Bus Transceiver and Registers
74ABT899CMSAX
ON Semiconductor
Enquête
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MOQ: 2000  MPQ: 1
TXRX W/GENERATOR&CHECKER 28SSOP
28-SSOP (0.209",5.30mm Width) 9 Parity Generator/Checker
SN74ABT8543DLR
Texas Instruments
Enquête
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MOQ: 1000  MPQ: 1
IC SCAN TEST DEVICE 28-SSOP
28-BSSOP (0.295",7.50mm Width) 8 Scan Test Device with Registered Bus Transceiver
SN74ABT8652DLR
Texas Instruments
Enquête
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MOQ: 1000  MPQ: 1
IC SCAN TEST DEVICE 28-SSOP
28-BSSOP (0.295",7.50mm Width) 8 Scan Test Device with Bus Transceiver and Registers
SN74ABT8652DLRG4
Texas Instruments
Enquête
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MOQ: 1000  MPQ: 1
IC SCAN TEST DEVICE 28-SSOP
28-BSSOP (0.295",7.50mm Width) 8 Scan Test Device with Bus Transceiver and Registers
SN74ABT8952DLR
Texas Instruments
Enquête
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MOQ: 1000  MPQ: 1
IC SCAN TESST DEVICE 28-SSOP
28-BSSOP (0.295",7.50mm Width) 8 Scan Test Device with Registered Bus Transceiver
SN74ABT8952DLRG4
Texas Instruments
Enquête
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MOQ: 1000  MPQ: 1
IC SCAN TESST DEVICE 28-SSOP
28-BSSOP (0.295",7.50mm Width) 8 Scan Test Device with Registered Bus Transceiver
74ABT899DB,118
NXP USA Inc.
Enquête
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MOQ: 1000  MPQ: 1
IC 9BIT DUAL LATCH TXRX 28SSOP
28-SSOP (0.209",5.30mm Width) 9 Parity Generator/Checker