- Series：
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- Operating Temperature：
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- Supplier Device Package：
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- Supply Voltage：
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- Logic Type：
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- Conditions sélectionnées:
Découvrez les produits 16
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Supplier Device Package | Number of Bits | Supply Voltage | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Supplier Device Package | Number of Bits | Supply Voltage | Logic Type | |
|
|
|
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 45 MPQ: 1
|
IC ARITHMETIC LOGIC 4BIT 24-DIP
|
74F | 0°C ~ 70°C | 24-PDIP | 4 | 4.5 V ~ 5.5 V | Arithmetic Logic Unit | ||
|
|
|
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 30 MPQ: 1
|
IC DRIVER/RCVR QUAD BUS 24-DIP
|
10H | 0°C ~ 75°C | 24-PDIP | 4 | - | Driver/Receiver | ||
|
|
|
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 30 MPQ: 1
|
IC DRIVER/RCVR QUAD BUS 24-DIP
|
10H | 0°C ~ 75°C | 24-PDIP | 4 | - | Driver/Receiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 45 MPQ: 1
|
IC ARITHMETIC LOGIC UNIT 24DIP
|
74AS | 0°C ~ 70°C | 24-PDIP | - | 4.5 V ~ 5.5 V | Arithmetic Logic Unit | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 120 MPQ: 1
|
IC TRANSCEIVER 1-9BIT 24DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Inverting Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Inverting Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE LATCH 24-DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Latches | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE W/FF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE W/FF 24-DIP
|
74BCT | 0°C ~ 70°C | 24-PDIP | 8 | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
NXP USA Inc. |
Enquête
|
- |
-
|
MOQ: 600 MPQ: 1
|
IC BUFFER/LDRIVER OCTAL 24-DIP
|
74F | 0°C ~ 70°C | 24-DIP | 8 | 4.5 V ~ 5.5 V | Buffer/Driver with Parity | ||
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 45 MPQ: 1
|
IC ARITHMETIC LOGIC UNIT 24DIP
|
74AS | 0°C ~ 70°C | 24-PDIP | - | 4.5 V ~ 5.5 V | Arithmetic Logic Unit |
