- Packaging：
-
- Series：
-
- Operating Temperature：
-
- Supplier Device Package：
-
- Conditions sélectionnées:
Découvrez les produits 24
 |
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Operating Temperature | Supplier Device Package | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Series | Operating Temperature | Supplier Device Package | Number of Bits | Logic Type | |
|
|
|
Texas Instruments |
196
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SOIC
|
Tube | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
755
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 28-SOIC
|
Tube | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
50
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
Tube | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN-PATH LINKER 28-SOIC
|
Tape & Reel (TR) | 74ACT | 0°C ~ 70°C | 28-SOIC | 4 | SCAN-PATH LINKERS | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-PATH LINKER 28-SOIC
|
Cut Tape (CT) | 74ACT | 0°C ~ 70°C | 28-SOIC | 4 | SCAN-PATH LINKERS | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-PATH LINKER 28-SOIC
|
- | 74ACT | 0°C ~ 70°C | 28-SOIC | 4 | SCAN-PATH LINKERS | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 40 MPQ: 1
|
IC SCAN-PATH LINKER 28-SOIC
|
Tube | 74ACT | 0°C ~ 70°C | 28-SOIC | 4 | SCAN-PATH LINKERS | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SOIC
|
Tube | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
TXRX W/GENERATOR&CHECKER 28SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 9 | Parity Generator/Checker | ||
|
|
|
ON Semiconductor |
Enquête
|
- |
-
|
MOQ: 52 MPQ: 1
|
TXRX W/GENERATOR&CHECKER 28SOIC
|
Tube | 74ABT | -40°C ~ 85°C | 28-SOIC | 9 | Parity Generator/Checker | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28-SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC SCAN TEST DEVICE 28SOIC
|
Tape & Reel (TR) | 74ABT | -40°C ~ 85°C | 28-SOIC | 8 | Scan Test Device with Registered Bus Transceiver |
