Découvrez les produits 21
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Packaging Series Package / Case Supplier Device Package Logic Type
SN74LVTH182512DGGR
Texas Instruments
Enquête
-
-
MOQ: 2000  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-TSSOP
Tape & Reel (TR) 74LVTH 64-TFSOP (0.240",6.10mm Width) 64-TSSOP ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182512DGGR
Texas Instruments
8,355
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-TSSOP
Cut Tape (CT) 74LVTH 64-TFSOP (0.240",6.10mm Width) 64-TSSOP ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182512DGGR
Texas Instruments
8,355
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-TSSOP
- 74LVTH 64-TFSOP (0.240",6.10mm Width) 64-TSSOP ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APMR
Texas Instruments
Enquête
-
-
MOQ: 1000  MPQ: 1
IC 18BIT SCAN TST DEV UBT 64LQFP
Tape & Reel (TR) 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APMR
Texas Instruments
980
3 jours
-
MOQ: 1  MPQ: 1
IC 18BIT SCAN TST DEV UBT 64LQFP
Cut Tape (CT) 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APMR
Texas Instruments
980
3 jours
-
MOQ: 1  MPQ: 1
IC 18BIT SCAN TST DEV UBT 64LQFP
- 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182502APMR
Texas Instruments
Enquête
-
-
MOQ: 1000  MPQ: 1
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
Tape & Reel (TR) 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182502APMR
Texas Instruments
406
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
Cut Tape (CT) 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182502APMR
Texas Instruments
406
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
- 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APM
Texas Instruments
3,449
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182502APM
Texas Instruments
1,756
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18646APM
Texas Instruments
303
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Transceivers and Registers
SN74LVTH182652APM
Texas Instruments
299
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN TEST DEVICE ABT 64-LQFP
Tray 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Transceivers and Registers
SN74LVTH18652APM
Texas Instruments
256
3 jours
-
MOQ: 1  MPQ: 1
IC TXRX/REG 18BIT 3.3V 64-LQFP
Tube 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Transceivers and Registers
8V182512IDGGREP
Texas Instruments
Enquête
-
-
MOQ: 2000  MPQ: 1
IC ABT SCAN TEST DEV3.3V 64TSSOP
Tape & Reel (TR) - 64-TFSOP (0.240",6.10mm Width) 64-TSSOP ABT Scan Test Device With Universal Bus Transceivers
8V182512IDGGREP
Texas Instruments
1,991
3 jours
-
MOQ: 1  MPQ: 1
IC ABT SCAN TEST DEV3.3V 64TSSOP
Cut Tape (CT) - 64-TFSOP (0.240",6.10mm Width) 64-TSSOP ABT Scan Test Device With Universal Bus Transceivers
8V182512IDGGREP
Texas Instruments
1,991
3 jours
-
MOQ: 1  MPQ: 1
IC ABT SCAN TEST DEV3.3V 64TSSOP
- - 64-TFSOP (0.240",6.10mm Width) 64-TSSOP ABT Scan Test Device With Universal Bus Transceivers
74LVTH18502APMRG4
Texas Instruments
Enquête
-
-
MOQ: 1000  MPQ: 1
IC 18BIT UNIV BUS TXRX 64-LQFP
Tape & Reel (TR) 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APMG4
Texas Instruments
Enquête
-
-
MOQ: 160  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182646APM
Texas Instruments
Enquête
-
-
MOQ: 160  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 74LVTH 64-LQFP 64-LQFP (10x10) ABT Scan Test Device With Transceivers and Registers