- Packaging：
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- Operating Temperature：
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- Package / Case：
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- Supplier Device Package：
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- Mounting Type：
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- Conditions sélectionnées:
Découvrez les produits 35
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Operating Temperature | Package / Case | Supplier Device Package | Mounting Type | Number of Bits | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Packaging | Operating Temperature | Package / Case | Supplier Device Package | Mounting Type | Number of Bits | Logic Type | |
|
|
|
Texas Instruments |
736
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
Tube | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with Buffers | ||
|
|
|
Texas Instruments |
1,183
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC MEMORY DECODER 20-SOIC
|
Tube | 0°C ~ 75°C | 20-SOIC (0.295"，7.50mm Width) | 20-SOIC | Surface Mount | - | Memory Decoder | ||
|
|
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Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-SOIC
|
Tape & Reel (TR) | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
10
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE W/FF 24-SOIC
|
Tube | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
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Texas Instruments |
Enquête
|
- |
-
|
MOQ: 140 MPQ: 1
|
IC DECODER MEM DUAL 2-4 20-DIP
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Tube | 0°C ~ 75°C | 20-DIP (0.300"，7.62mm) | 20-PDIP | Through Hole | - | Memory Decoder | ||
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|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 125 MPQ: 1
|
IC TRANSCEIVER 1-9BIT 24SOIC
|
Tube | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 125 MPQ: 1
|
IC MEMORY DECODER 20SOIC
|
Tube | 0°C ~ 75°C | 20-SOIC (0.295"，7.50mm Width) | 20-SOIC | Surface Mount | - | Memory Decoder | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 75 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
Tube | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 75 MPQ: 1
|
IC SCAN TEST DEVICE LATCH 24SOIC
|
Tube | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with D-Type Latches | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-SOIC
|
Tube | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
Tube | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC DECODER MEM DUAL 2-4 20-SOIC
|
Tape & Reel (TR) | 0°C ~ 75°C | 20-SOIC (0.295"，7.50mm Width) | 20-SOIC | Surface Mount | - | Memory Decoder | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC TRANSCEIVER 1-9BIT 24SOIC
|
Tape & Reel (TR) | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC TRANSCEIVER 1-9BIT 24SOIC
|
Tape & Reel (TR) | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 120 MPQ: 1
|
IC TRANSCEIVER 1-9BIT 24DIP
|
Tube | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | Through Hole | 8 | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
Tape & Reel (TR) | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
Tape & Reel (TR) | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
Tube | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | Through Hole | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 60 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-DIP
|
Tube | 0°C ~ 70°C | 24-DIP (0.300"，7.62mm) | 24-PDIP | Through Hole | 8 | Scan Test Device with Inverting Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 2000 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
Tape & Reel (TR) | 0°C ~ 70°C | 24-SOIC (0.295"，7.50mm Width) | 24-SOIC | Surface Mount | 8 | Scan Test Device with Buffers |
