Découvrez les produits 22
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Packaging Number of Bits Logic Type
SN74LVTH182504APM
Texas Instruments
1,690
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 20 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18504APMR
Texas Instruments
Enquête
-
-
MOQ: 1000  MPQ: 1
IC 20BIT SCAN TST DEV UBT 64LQFP
Tape & Reel (TR) 20 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18504APMR
Texas Instruments
1,625
3 jours
-
MOQ: 1  MPQ: 1
IC 20BIT SCAN TST DEV UBT 64LQFP
Cut Tape (CT) 20 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18504APMR
Texas Instruments
1,625
3 jours
-
MOQ: 1  MPQ: 1
IC 20BIT SCAN TST DEV UBT 64LQFP
- 20 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APMR
Texas Instruments
Enquête
-
-
MOQ: 1000  MPQ: 1
IC 18BIT SCAN TST DEV UBT 64LQFP
Tape & Reel (TR) 18 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APMR
Texas Instruments
980
3 jours
-
MOQ: 1  MPQ: 1
IC 18BIT SCAN TST DEV UBT 64LQFP
Cut Tape (CT) 18 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APMR
Texas Instruments
980
3 jours
-
MOQ: 1  MPQ: 1
IC 18BIT SCAN TST DEV UBT 64LQFP
- 18 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182502APMR
Texas Instruments
Enquête
-
-
MOQ: 1000  MPQ: 1
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
Tape & Reel (TR) 18 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182502APMR
Texas Instruments
406
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
Cut Tape (CT) 18 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182502APMR
Texas Instruments
406
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/TRANSCVR 64LQFP
- 18 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APM
Texas Instruments
3,449
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 18 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH182502APM
Texas Instruments
1,756
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 18 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18504APM
Texas Instruments
479
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 20 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18646APM
Texas Instruments
303
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 18 ABT Scan Test Device With Transceivers and Registers
SN74LVTH182652APM
Texas Instruments
299
3 jours
-
MOQ: 1  MPQ: 1
IC SCAN TEST DEVICE ABT 64-LQFP
Tray 18 ABT Scan Test Device With Transceivers and Registers
SN74LVTH18652APM
Texas Instruments
256
3 jours
-
MOQ: 1  MPQ: 1
IC TXRX/REG 18BIT 3.3V 64-LQFP
Tube 18 ABT Scan Test Device With Transceivers and Registers
74LVTH18502APMRG4
Texas Instruments
Enquête
-
-
MOQ: 1000  MPQ: 1
IC 18BIT UNIV BUS TXRX 64-LQFP
Tape & Reel (TR) 18 ABT Scan Test Device With Universal Bus Transceivers
74LVTH182504APMG4
Texas Instruments
Enquête
-
-
MOQ: 160  MPQ: 1
IC 20BIT UNIV BUS TXRX 64-LQFP
Tray 20 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18502APMG4
Texas Instruments
Enquête
-
-
MOQ: 160  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 18 ABT Scan Test Device With Universal Bus Transceivers
SN74LVTH18504APMG4
Texas Instruments
Enquête
-
-
MOQ: 160  MPQ: 1
IC SCAN-TEST-DEV/XCVR 64-LQFP
Tray 20 ABT Scan Test Device With Universal Bus Transceivers