- Operating Temperature：
-
- Supply Voltage：
-
- Logic Type：
-
- Conditions sélectionnées:
Découvrez les produits 15
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Number of Bits | Supply Voltage | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Number of Bits | Supply Voltage | Logic Type | |
|
|
|
Texas Instruments |
3,627
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 24-SOIC
|
74ABT | -40°C ~ 85°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
736
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||
|
|
|
Texas Instruments |
10
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEVICE W/FF 24-SOIC
|
74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Edge-Triggered Flip-Flops | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 325 MPQ: 1
|
IC 10BIT VOLTAGE CLAMP 24-SOIC
|
- | -40°C ~ 85°C | 10 | - | Voltage Clamp | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 125 MPQ: 1
|
IC TRANSCEIVER 1-9BIT 24SOIC
|
74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | 8-Bit to 9-Bit Parity Bus Transceiver | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 100 MPQ: 1
|
IC SCAN TEST DEVICE 24SOIC
|
74ABT | -40°C ~ 85°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 75 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Inverting Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 75 MPQ: 1
|
IC SCAN TEST DEVICE LATCH 24SOIC
|
74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with D-Type Latches | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC SCAN TEST DEVICE TXRX 24-SOIC
|
74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Bus Transceivers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC SCAN TEST DEVICE BUFF 24-SOIC
|
74BCT | 0°C ~ 70°C | 8 | 4.5 V ~ 5.5 V | Scan Test Device with Buffers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC 10-BIT SCAN PORT XCVR 24-SOIC
|
74LVT | -40°C ~ 85°C | 10 | 2.7 V ~ 3.6 V | Addressable Scan Ports | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC TEST-BUS CONTROLLER 24-SOIC
|
74LVT | -40°C ~ 85°C | 8 | 2.7 V ~ 3.6 V | Embedded Test-Bus Controllers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC ARITHMETIC LOGIC UNIT 24-SOIC
|
74AS | 0°C ~ 70°C | - | 4.5 V ~ 5.5 V | Arithmetic Logic Unit | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC ARITHMETIC LOGIC UNIT 24-SOIC
|
74AS | 0°C ~ 70°C | - | 4.5 V ~ 5.5 V | Arithmetic Logic Unit | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 50 MPQ: 1
|
IC ARITHMETIC LOGIC UNIT 24SOIC
|
74AS | 0°C ~ 70°C | - | 4.5 V ~ 5.5 V | Arithmetic Logic Unit |
