- Conditions sélectionnées:
Découvrez les produits 6
 |
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Logic Type | |
|---|---|---|---|---|---|---|---|---|---|---|
|
Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Logic Type | |
|
|
|
Texas Instruments |
1,185
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SSOP
|
Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
200
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN TEST DEV/TXRX 28-SSOP
|
Scan Test Device with Registered Bus Transceiver | ||
|
|
|
Texas Instruments |
231
|
3 jours |
-
|
MOQ: 1 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SSOP
|
Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 80 MPQ: 1
|
IC SCAN TEST DEVICE 28-SSOP
|
Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 40 MPQ: 1
|
IC SCAN TEST DEVICE 28-SSOP
|
Scan Test Device with Bus Transceiver and Registers | ||
|
|
|
Texas Instruments |
Enquête
|
- |
-
|
MOQ: 40 MPQ: 1
|
IC SCAN-TEST-DEV/XCVR 28-SSOP
|
Scan Test Device with Registered Bus Transceiver |
