- Series：
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- Operating Temperature：
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- Package / Case：
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- Features：
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- Logic Type：
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- Current - Output High, Low：
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- Conditions sélectionnées:
Découvrez les produits 38
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Package / Case | Number of Circuits | Features | Number of Inputs | Current - Quiescent (Max) | Logic Type | Current - Output High, Low | Max Propagation Delay @ V, Max CL | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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Image | Numéro de pièce | Fabricant | Quantité | Délai de livraison | Prix unitaire | Acheter | Description | Series | Operating Temperature | Package / Case | Number of Circuits | Features | Number of Inputs | Current - Quiescent (Max) | Logic Type | Current - Output High, Low | Max Propagation Delay @ V, Max CL | |
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STMicroelectronics |
4,019
|
3 jours |
-
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MOQ: 1 MPQ: 1
|
IC GATE NAND 3CH 3-INP 14DIP
|
74HC | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 3 | - | 3 | 1μA | NAND Gate | 5.2mA，5.2mA | 13ns @ 6V，50pF | ||
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STMicroelectronics |
2,837
|
3 jours |
-
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MOQ: 1 MPQ: 1
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IC GATE NAND 4CH 2-INP 14DIP
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74HC | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | Open Drain | 2 | 1μA | NAND Gate | -，5.2mA | 10ns @ 6V，50pF | ||
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STMicroelectronics |
3
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3 jours |
-
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MOQ: 1 MPQ: 1
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IC GATE XOR 4CH 2-INP 14DIP
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74HC | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | - | 2 | 1μA | XOR (Exclusive OR) | 5.2mA，5.2mA | 19ns @ 6V，50pF | ||
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NXP USA Inc. |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC GATE NAND 2CH 4-INP 14DIP
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74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 2 | - | 4 | 2μA | NAND Gate | 5.2mA，5.2mA | 15ns @ 6V，50pF | ||
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NXP USA Inc. |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC GATE NAND 3CH 3-INP 14DIP
|
74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 3 | - | 3 | 2μA | NAND Gate | 5.2mA，5.2mA | 16ns @ 6V，50pF | ||
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NXP USA Inc. |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC GATE NAND 4CH 2-INP 14DIP
|
74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | - | 2 | 40μA | NAND Gate | 5.2mA，5.2mA | 7ns @ 6V，50pF | ||
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NXP USA Inc. |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC GATE NAND 4CH 2-INP 14DIP
|
74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | Open Drain | 2 | 2μA | NAND Gate | -，5.2mA | 16ns @ 6V，50pF | ||
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NXP USA Inc. |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC GATE OR 3CH 3-INP 14DIP
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74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 3 | - | 3 | 2μA | OR Gate | 5.2mA，5.2mA | 17ns @ 6V，50pF | ||
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NXP USA Inc. |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC INVERTER 6CH 6-INP 14DIP
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74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 6 | - | 6 | 2μA | Inverter | 5.2mA，5.2mA | 14ns @ 6V，50pF | ||
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STMicroelectronics |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC GATE OR 3CH 3-INP 14DIP
|
74HC | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 3 | - | 3 | 1μA | OR Gate | 5.2mA，5.2mA | 14ns @ 6V，50pF | ||
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STMicroelectronics |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC GATE OR 4CH 2-INP 14DIP
|
74HC | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | - | 2 | 1μA | OR Gate | 5.2mA，5.2mA | 13ns @ 6V，50pF | ||
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|
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STMicroelectronics |
Enquête
|
- |
-
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MOQ: 5000 MPQ: 1
|
IC GATE NAND 2CH 4-INP 14DIP
|
74HC | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 2 | - | 4 | 1μA | NAND Gate | 5.2mA，5.2mA | 14ns @ 6V，50pF | ||
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STMicroelectronics |
Enquête
|
- |
-
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MOQ: 5000 MPQ: 1
|
IC GATE NOR 4CH 2-INP 14DIP
|
74HC | -55°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | - | 2 | 1μA | NOR Gate | 5.2mA，5.2mA | 13ns @ 6V，50pF | ||
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|
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NXP USA Inc. |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC GATE XOR 4CH 2-INP 14DIP
|
74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | - | 2 | 2μA | XNOR (Exclusive NOR) | 5.2mA，5.2mA | 20ns @ 6V，50pF | ||
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NXP USA Inc. |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC GATE AND 4CH 2-INP 14DIP
|
74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | - | 2 | 2μA | AND Gate | 5.2mA，5.2mA | 15ns @ 6V，50pF | ||
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|
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NXP USA Inc. |
Enquête
|
- |
-
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MOQ: 1000 MPQ: 1
|
IC GATE NOR 2CH 4-INP 14DIP
|
74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 2 | - | 4 | 2μA | NOR Gate | 5.2mA，5.2mA | 17ns @ 6V，50pF | ||
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|
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NXP USA Inc. |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC GATE OR 4CH 2-INP 14DIP
|
74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | - | 2 | 2μA | OR Gate | 5.2mA，5.2mA | 15ns @ 6V，50pF | ||
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|
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NXP USA Inc. |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC GATE NOR 4CH 2-INP 14DIP
|
74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 4 | - | 2 | 2μA | NOR Gate | 5.2mA，5.2mA | 15ns @ 6V，50pF | ||
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|
|
NXP USA Inc. |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC GATE AND 3CH 3-INP 14DIP
|
74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 3 | - | 3 | 2μA | AND Gate | 5.2mA，5.2mA | 17ns @ 6V，50pF | ||
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|
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NXP USA Inc. |
Enquête
|
- |
-
|
MOQ: 1000 MPQ: 1
|
IC GATE NAND 1CH 8-INP 14DIP
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74HC | -40°C ~ 125°C | 14-DIP (0.300"，7.62mm) | 1 | - | 8 | 2μA | NAND Gate | 5.2mA，5.2mA | 22ns @ 6V，50pF |
