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Découvrez les produits 19
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Packaging Voltage - Supply Operating Temperature Package / Case Supplier Device Package Number of Circuits Number of Inputs Current - Quiescent (Max) Logic Type Logic Level - Low Logic Level - High
74LVC2G00GXX
Nexperia USA Inc.
10,000
3 jours
-
MOQ: 10000  MPQ: 1
IC GATE NAND 2CH 2-INP 8X2SON
Tape & Reel (TR) 3.3 V ~ 5 V -40°C ~ 125°C 8-XFDFN Exposed Pad 8-X2SON (1.35x0.8) 2 2 4μA NAND Gate 0.1 V ~ 0.8 V 0.95 V ~ 3.4 V
74LVC2G00GXX
Nexperia USA Inc.
10,000
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP 8X2SON
Cut Tape (CT) 3.3 V ~ 5 V -40°C ~ 125°C 8-XFDFN Exposed Pad 8-X2SON (1.35x0.8) 2 2 4μA NAND Gate 0.1 V ~ 0.8 V 0.95 V ~ 3.4 V
74LVC2G00GXX
Nexperia USA Inc.
10,000
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP 8X2SON
- 3.3 V ~ 5 V -40°C ~ 125°C 8-XFDFN Exposed Pad 8-X2SON (1.35x0.8) 2 2 4μA NAND Gate 0.1 V ~ 0.8 V 0.95 V ~ 3.4 V
74LVC2G38GXX
Nexperia USA Inc.
10,000
3 jours
-
MOQ: 10000  MPQ: 1
IC GATE NAND 2CH 2-INP 8X2SON
Tape & Reel (TR) 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN Exposed Pad 8-X2SON (1.35x0.8) 2 2 4μA NAND Gate 0.1 V ~ 0.8 V -
74LVC2G38GXX
Nexperia USA Inc.
10,000
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP 8X2SON
Cut Tape (CT) 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN Exposed Pad 8-X2SON (1.35x0.8) 2 2 4μA NAND Gate 0.1 V ~ 0.8 V -
74LVC2G38GXX
Nexperia USA Inc.
10,000
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP 8X2SON
- 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN Exposed Pad 8-X2SON (1.35x0.8) 2 2 4μA NAND Gate 0.1 V ~ 0.8 V -
74LVC1G11FW4-7
Diodes Incorporated
30,000
3 jours
-
MOQ: 5000  MPQ: 1
IC GATE AND 1CH 3-INP DFN1010-6
Tape & Reel (TR) 1.65 V ~ 5.5 V -40°C ~ 125°C 6-XFDFN X2-DFN1010-6 1 3 40μA AND Gate 0.7 V ~ 0.8 V 1.7 V ~ 2 V
74LVC1G11FW4-7
Diodes Incorporated
7,749
3 jours
-
MOQ: 1  MPQ: 1
IC GATE AND 1CH 3-INP DFN1010-6
Cut Tape (CT) 1.65 V ~ 5.5 V -40°C ~ 125°C 6-XFDFN X2-DFN1010-6 1 3 40μA AND Gate 0.7 V ~ 0.8 V 1.7 V ~ 2 V
74LVC1G11FW4-7
Diodes Incorporated
Enquête
-
-
MOQ: 1  MPQ: 1
IC GATE AND 1CH 3-INP DFN1010-6
- 1.65 V ~ 5.5 V -40°C ~ 125°C 6-XFDFN X2-DFN1010-6 1 3 40μA AND Gate 0.7 V ~ 0.8 V 1.7 V ~ 2 V
74LVC2G00RA3-7
Diodes Incorporated
Enquête
-
-
MOQ: 5000  MPQ: 1
IC GATE NAND 2CH 2-INP DFN1210-8
Tape & Reel (TR) 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN X2-DFN1210-8 2 2 40μA NAND Gate - -
74LVC2G00RA3-7
Diodes Incorporated
3,065
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP DFN1210-8
Cut Tape (CT) 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN X2-DFN1210-8 2 2 40μA NAND Gate - -
74LVC2G00RA3-7
Diodes Incorporated
3,065
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP DFN1210-8
- 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN X2-DFN1210-8 2 2 40μA NAND Gate - -
74LVC2G00HK3-7
Diodes Incorporated
Enquête
-
-
MOQ: 5000  MPQ: 1
IC GATE NAND 2CH 2-INP DFN1410-8
Tape & Reel (TR) 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN X2-DFN1410-8 2 2 40μA NAND Gate - -
74LVC2G00HK3-7
Diodes Incorporated
1,567
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP DFN1410-8
Cut Tape (CT) 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN X2-DFN1410-8 2 2 40μA NAND Gate - -
74LVC2G00HK3-7
Diodes Incorporated
1,567
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP DFN1410-8
- 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN X2-DFN1410-8 2 2 40μA NAND Gate - -
74LVC2G00HD4-7
Diodes Incorporated
Enquête
-
-
MOQ: 5000  MPQ: 1
IC GATE NAND 2CH 2-INP DFN2010-8
Tape & Reel (TR) 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN X2-DFN2010-8 2 2 40μA NAND Gate - -
74LVC2G00HD4-7
Diodes Incorporated
1,269
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP DFN2010-8
Cut Tape (CT) 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN X2-DFN2010-8 2 2 40μA NAND Gate - -
74LVC2G00HD4-7
Diodes Incorporated
1,269
3 jours
-
MOQ: 1  MPQ: 1
IC GATE NAND 2CH 2-INP DFN2010-8
- 1.65 V ~ 5.5 V -40°C ~ 125°C 8-XFDFN X2-DFN2010-8 2 2 40μA NAND Gate - -
74LVC1G11FW4-7
Diodes Incorporated
Enquête
-
-
MOQ: 5000  MPQ: 1
IC GATE AND 1CH 3-INP DFN1010-6
Tape & Reel (TR) 1.65 V ~ 5.5 V -40°C ~ 125°C (TA) 6-XFDFN X2-DFN1010-6 1 3 40μA AND Gate 0.7 V ~ 0.8 V 1.7 V ~ 2 V