Fabricant:
Supplier Device Package:
Voltage - Input Offset (Max):
Current - Input Bias (Max):
Current - Quiescent (Max):
Propagation Delay (Max):
Découvrez les produits 6
Image Numéro de pièce Fabricant Quantité Délai de livraison Prix ​​unitaire Acheter Description Packaging Package / Case Supplier Device Package Mounting Type Voltage - Input Offset (Max) Current - Input Bias (Max) Current - Quiescent (Max) Propagation Delay (Max)
NE529K
Texas Instruments
Enquête
-
-
MOQ: 500  MPQ: 1
IC COMPARATOR HS DIFF TO-100-10
Bulk TO-100-10 Metal Can TO-100-10 Through Hole 5mV @ 5V 30μA @ ±5V 20mA 20ns
NE521DR2G
ON Semiconductor
Enquête
-
-
MOQ: 2500  MPQ: 1
IC COMPARATOR DUAL DIFF 14-SOIC
Tape & Reel (TR) 14-SOIC (0.154",3.90mm Width) 14-SOIC Surface Mount 7.5mV @ ±4.75V 20μA @ ±5.25V 35mA 12ns
NE521DG
ON Semiconductor
Enquête
-
-
MOQ: 0  MPQ: 1
IC COMPARATOR DUAL DIFF 14-SOIC
Tube 14-SOIC (0.154",3.90mm Width) 14-SOIC Surface Mount 7.5mV @ ±4.75V 20μA @ ±5.25V 35mA 12ns
NE521DR2
ON Semiconductor
Enquête
-
-
MOQ: 2500  MPQ: 1
IC COMPARATOR DUAL DIFF 14-SOIC
Tape & Reel (TR) 14-SOIC (0.154",3.90mm Width) 14-SOIC Surface Mount 7.5mV @ ±4.75V 20μA @ ±5.25V 35mA 12ns
NE521N
ON Semiconductor
Enquête
-
-
MOQ: 175  MPQ: 1
IC COMP DUAL DIFF 14DIP
Tube 14-DIP (0.300",7.62mm) 14-PDIP Through Hole 7.5mV @ ±4.75V 20μA @ ±5.25V 35mA 12ns
NE521NG
ON Semiconductor
Enquête
-
-
MOQ: 500  MPQ: 1
IC COMPARATOR/SENSE AMP 14-DIP
Tube 14-DIP (0.300",7.62mm) 14-PDIP Through Hole 7.5mV @ ±4.75V 20μA @ ±5.25V 35mA 12ns